http://www.orihara-cn.com/jp/catalog/photoe/FSM/FSM-6000LEIR_E.pdf WebFSM 128. Stress Measurment. The FSM 128 uses a laser optical lever to measure the change of curvature. induced in a wafer due to deposited film. Pattern wafer measurment. The FSM 128 can perform non destructive measurment of pattern wafer bow fromthe front side of the. Wafer Flatness Measurment. This application allows inspection of incoming ...
Used FSM / FRONTIER SEMICONDUCTOR 128 #9188871 for sale
WebDescription: Used to measure film stress at room temperature or elevated temperatures. Also measures Wafer Bow Height and, with well characterized substrates, the film's … WebApr 1, 2001 · Frontier Semiconductor, 1631 N First Street, San Jose, CA 95112 , 408-452-8898 ( phone ), 408-452-8688 (fax) erin loughery norwich ct
Film Stress - Frontier Semi
WebConventional hydraulic fracturing provides a simple way to measure stress magnitude, s advance knowledge of rock properties is not essential, such as Young’s modulus and Poisson’s ratio. This method also offers a reliable and direct measurement of minimum horizontal principal stress at an accuracy of ± 5% (Ljunggren, et al., 2003). Another WebThis product propagates light along the surface of the glass, measure the surface stress and its depth by photoblastic technology. In particular, FSM-6000X is the only surface stress measuring device for measuring chemically strengthened glass. Errors caused by operator reduce helps it become an excellent device for product development and ... WebWhat is frequency-specific microcurrent (FSM)? Frequency-specific microcurrent (FSM) is a technique for treating pain by using low-level electrical current. The current is delivered … erin loughrey colorado